SURFACE FLAW DETECTION IN STRUCTURAL CERAMICS BY SCANNING PHOTOACOUSTIC-SPECTROSCOPY

被引：10

作者：

KHANDELWAL, PK ^{[1
]}

HEITMAN, PW ^{[1
]}

SILVERSMITH, AJ ^{[1
]}

WAKEFIELD, TD ^{[1
]}

机构：

[1] GILFORD INSTRUMENT LABS INC,OBERLIN,OH 44074

来源：

APPLIED PHYSICS LETTERS | 1980年 / 37卷 / 09期

关键词：

D O I：

10.1063/1.92071

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：779 / 781

页数：3

共 9 条

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[2]

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[5] HARDNESS, TOUGHNESS, AND BRITTLENESS - INDENTATION ANALYSIS [J].

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[6]

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ROSENCWAIG, A ;

GERSHO, A .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (01) :64-69

[8] PHOTO-ACOUSTIC SPECTROSCOPY OF SOLIDS [J].

ROSENCWAIG, A .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1977, 48 (09) :1133-1137

[9] SUBSURFACE STRUCTURES OF SOLIDS BY SCANNING PHOTOACOUSTIC MICROSCOPY [J].

WONG, YH ;

THOMAS, RL ;

POUCH, JJ .

APPLIED PHYSICS LETTERS, 1979, 35 (05) :368-369

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