RECENT PROBLEMS AND LIMITATIONS IN ANALYTICAL CHARACTERIZATION OF HIGH-PURITY MATERIAL

被引：57

作者：

TOLG, G ^{[1
]}

机构：

[1] MAX PLANCK INST MET FORSCH,LAB REINSTSTOFFE,SCHWABISCH GMUND,WEST GERMANY

来源：

关键词：

D O I：

10.1016/0039-9140(74)80123-2

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：327 / 345

页数：19

共 17 条

[1]

BALARIN M, 1971, WISS FORTSCHR, V21, P111

[2] ELEMENTARY ANALYSIS OF SULFUR IN NANOGRAM RANGE [J].

GRUNERT, A ;

TOLG, G .

[3]

GRUNWALD W, 1973, THESIS STUTTGART

[4]

KAISER G, 1971, Z ANAL CHEM, V253, P177

[5]

KAISER G, 1972, Z ANAL CHEM, V259, P257

[6]

KAISER GA, IN PRESS

[7]

KAISER H, 1973, METHODICUM CHIMICU 1, V1

KOTZ, L ;

TOLG, G ;

TSCHOPEL, P ;

KAISER, G .

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1972, 260 (03) :207-&

[9]

KUEHNER CC, 1972, ANAL CHEM, V44, P2050

[10]

MITCHELL JW, 1973, ANAL CHEM, V45, pA492