TRAP DEPTH IN EVAPORATED POLYPROPYLENE FROM MEASUREMENTS OF THERMALLY STIMULATED CURRENTS

被引:5
作者
IQBAL, T
HOGARTH, CA
机构
[1] Department of Physics, Brunel University, Uxbridge
关键词
D O I
10.1016/0040-6090(79)90495-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The occurrence of thermally stimulated currents in thin evaporated films of polypropylene was demonstrated and an analysis of the curves gave an electron trap depth of 0.33 eV in this material. © 1979.
引用
收藏
页码:23 / 26
页数:4
相关论文
共 6 条
[1]  
BUBE RH, 1960, PHOTOCONDUCTIVITY SO, P294
[2]   EXTENSIONS TO METHOD OF TRAP ANALYSIS BY THERMALLY STIMULATED CONDUCTIVITY CURVES [J].
HAINE, ME ;
CARLEYRE.RE .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (10) :1257-&
[3]   SOME ELECTRICAL-PROPERTIES OF EVAPORATED POLYPROPYLENE [J].
HOGARTH, CA ;
IQBAL, T .
THIN SOLID FILMS, 1978, 51 (03) :L45-L46
[4]  
Luff P. P., 1970, Thin Solid Films, V6, P175, DOI 10.1016/0040-6090(70)90038-6
[5]   TRANSPORT OF PHOTOGENERATED CARRIERS IN POLY N-VINYLCARBAZOLE [J].
SLOWIK, JH .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (07) :2982-2987
[6]  
ZOR M, 1977, THESIS BRUNEL U