SIMPLE METHOD OF THIN-FILM ANALYSIS IN ELECTRON-PROBE MICROANALYZER

被引：44

作者：

BISHOP, HE ^{[1
]}

POOLE, DM ^{[1
]}

机构：

[1] ATOM ENERGY RES ESTAB,MAT DEV DIV,HARWELL,ENGLAND

来源：

关键词：

D O I：

10.1088/0022-3727/6/9/318

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1142 / 1158

页数：17

共 6 条

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BISHOP, HE
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (06): : 703 - &
[2] ABSORPTION AND ATOMIC NUMBER CORRECTIONS IN ELECTRON-PROBE X-RAY MICROANALYSIS
BISHOP, HE
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (06) : 673 - &
[3] COLBY JW, 1968, ADVANCES XRAY ANALYS, V11, P287
[4] DUNCUMB P, 1966, XRAY OPTICS MICROANA
[5] ANGULAR DISTRIBUTION OF CHARACTERISTIC X RADIATION + ITS ORIGIN WITHIN SOLID TARGET
GREEN, M
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1964, 83 (5333): : 435 - +
[6] Reuter W., 1972, 6 INT C XRAY OPT MIC, P121