ROLE OF CONDENSATION PHENOMENA IN MEASUREMENT OF FILM THICKNESS BY OSCILLATING QUARTZ CRYSTAL METHOD

被引：7

作者：

BAKOS, J

NAGY, G

SZIGETI, J

机构：

来源：

关键词：

D O I：

10.1063/1.1708055

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4433 / &

共 15 条

[1]

ABELES J, PRIVATE COMMUNICATIO

[2]

BAKOS J, 1964, KFKI KOZL, V12, P317

BATH, HHA ;

STECKELMACHER, W .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (03) :144-+

[4]

BORN M, 1933, OPTIK, P327

[5]

Born M., 1933, OPTIK LEHRBUCH ELEKT, V76, P337

[6]

CAMPBELL DS, 1961, 7 NAT S VAC T, P313

[7]

Heavens O. S., 1955, OPTICAL PROPERTIES T

[8]

HOLLAND L, 1956, VACUUM DEPOSITION TH, P256

[9]

Jacobsson R., 1966, PROG OPT, V5

KOPPELMANN, G ;

KREBS, K .

ZEITSCHRIFT FUR PHYSIK, 1961, 163 (01) :539-+