ELECTRODEPOSITION AND CHARACTERIZATION OF SNS THIN-FILMS

被引：84

作者：

MISHRA, K

RAJESHWAR, K

WEISS, A

MURLEY, M

ENGELKEN, RD

SLAYTON, M

MCCLOUD, HE

机构：

[1] UNIV TEXAS,DEPT PHYS,ARLINGTON,TX 76019

[2] LTV,DALLAS,TX 75267

[3] ARKANSAS STATE UNIV,DEPT ENGN,STATE UNIV,AR 72467

[4] ARKANSAS STATE UNIV,DEPT COMP SCI MATH & PHYS,STATE UNIV,AR 72467

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1989年 / 136卷 / 07期

关键词：

D O I：

10.1149/1.2097082

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：1915 / 1923

页数：9

共 40 条

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[9] ELECTRODEPOSITION AND MATERIAL CHARACTERIZATION OF CUXS FILMS [J].

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