CHARACTERISTICS OF 2-REGION SATURATION PHENOMENA

被引:23
作者
CLARK, LE
机构
[1] Motorola Semiconductor Products Division, Phoenix, Ariz.
关键词
D O I
10.1109/T-ED.1969.16572
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Diffused base bipolar transistors, especially highvoltage types, often exhibit two pronounced saturation regions. This paper elucidates the qualitative and quantitative features of this behavior which is due to conductivity modulation of the lightly doped collector region. The transport equations for ambipolar conduction in the collector region are solved with a minimum of simplifying assumptions. It is shown how this portion of the solution explains the general features of the phenomenon. A complete solution for the collector V-I characteristics depends on an explicit knowledge of the recombination statistics in both the base and collector regions. A simple case is considered to demonstrate the detailed dependence of the phenomena on the physical structure. Design tradeoffs involved in the control of the V-I characteristics are discussed in the light of the results obtained from the analysis. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
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页码:113 / &
相关论文
共 2 条
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PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1967, 55 (08) :1384-&
[2]   THE DEPENDENCE OF TRANSISTOR PARAMETERS ON THE DISTRIBUTION OF BASE LAYER RESISTIVITY [J].
MOLL, JL ;
ROSS, IM .
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