SOFT-X-RAY SPECTROSCOPY AS A METHOD FOR STUDYING CHEMICAL INTERACTIONS AT DEEP INTERFACES

被引：13

作者：

BONNELLE, C

VERGAND, F

机构：

来源：

JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE | 1989年 / 86卷 / 06期

关键词：

D O I：

10.1051/jcp/19898601293

中图分类号：

Q5 [生物化学]; Q7 [分子生物学];

学科分类号：

071010 ; 081704 ;

摘要：

引用

页码：1293 / 1302

页数：10

共 17 条

[1] APPLICATION OF GRAZING-INCIDENCE X-RAY-DIFFRACTION (GIXD) TO THE STUDY OF NITROGEN IMPLANTED METALLIC SURFACES [J].

ARNAUD, Y ;

BRUNEL, M ;

DEBECDELIEVRE, AM ;

THEVENARD, P .

JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE, 1987, 84 (02) :341-345

[2]

BARRET C, 1985, COUCHES MINCES, V40, P129

[3]

BARRET C, 1988, IN PRESS REV PHYSIQU

[4] ELECTRONIC-STRUCTURE OF NI-AL INTERFACES [J].

BONNELLE, C ;

CYROTLACKMANN, F ;

JONNARD, P ;

JULIEN, JP ;

MAYOU, D ;

VERGAND, F .

PHYSICA SCRIPTA, 1988, 38 (01) :100-102

[5] ELECTRON-STATES AT SOLID-SOLID INTERFACES [J].

BONNELLE, C ;

VERGAND, F .

JOURNAL DE CHIMIE PHYSIQUE ET DE PHYSICO-CHIMIE BIOLOGIQUE, 1987, 84 (02) :187-195

[6]

CAZAUX J, 1988, CR ACAD SCI II, V306, P9

[7]

DEJARDINHORGUES.C, 1976, J PHYS C SOLID STATE, V9, P633

[8] ULTRAVIOLET BREMSSTRAHLUNG SPECTROSCOPY [J].

DOSE, V .

PROGRESS IN SURFACE SCIENCE, 1983, 13 (03) :225-284

[9] NICKEL 3D ELECTRON-DISTRIBUTION OF SMALL PARTICLES EMBEDDED IN SIO AND OF BULK NICKEL-SIO INTERFACE [J].

FARGUES, D ;

VERGAND, F ;

BONNELLE, C .

SURFACE SCIENCE, 1985, 156 (JUN) :590-596

[10] TRANSMISSION, ENERGY-DISTRIBUTION, AND SE EXCITATION OF FAST ELECTRONS IN THIN SOLID FILMS [J].

FITTING, HJ .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 26 (02) :525-535

← 1 2 →