NEON MIGRATION IN TIO2-SIO2 GLASSES

被引:10
作者
SHELBY, JE [1 ]
机构
[1] SANDIA LABS,PHYS RES DIV,LIVERMORE,CA 94550
关键词
D O I
10.1111/j.1151-2916.1973.tb12511.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:340 / 340
页数:1
相关论文
共 13 条
[1]  
Anderson O. L., 1954, J AM CERAM SOC, V37, P573, DOI [DOI 10.1111/J.1151-2916.1954.TB13991.X, 10.1111/j.1151-2916.1954.tb13991.x]
[2]  
DOREMUS RH, 1962, MODERN ASPECTS VITRE, V2
[3]  
Frenkel J., 1947, KINETIC THEORY LIQUI
[4]   DIFFUSION AND PERMEATION OF HE,NE,AR,KR AND D2 THROUGH SILICON OXIDE THIN FILMS [J].
PERKINS, WG ;
BEGEAL, DR .
JOURNAL OF CHEMICAL PHYSICS, 1971, 54 (04) :1683-&
[5]  
SCHULTZ PC, 1970, 3 C PHYS NONCR SOL U
[6]   HELIUM MIGRATION IN TIO2-SIO2 GLASSES [J].
SHELBY, JE .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1972, 55 (04) :195-&
[7]   HELIUM MIGRATION IN GLASS-FORMING OXIDES [J].
SHELBY, JE .
JOURNAL OF APPLIED PHYSICS, 1972, 43 (07) :3068-&
[8]   TEMPERATURE DEPENDENCE OF HE DIFFUSION IN VITREOUS SIO2 [J].
SHELBY, JE .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1971, 54 (02) :125-&
[9]  
SHELBY JE, 1972, PHYS CHEM GLASSES, V13, P167
[10]   DIFFUSION OF HELIUM ISOTOPES IN VITREOUS SILICA [J].
SHELBY, JE .
PHYSICAL REVIEW B, 1971, 4 (08) :2681-&