INSITU MEASUREMENTS OF THE STRESS CHANGES IN THIN-FILM ELECTRODES

[1] INTERNAL STRESSES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 606 - +

[2] NEW TECHNIQUE FOR MEASUREMENT OF ELECTRODE STRAIN DURING ELECTROCHEMICAL REACTIONS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (01) : 45 - 51

[3] CAMPBELL DS, 1970, HDB THIN FILM TECHNO, V12, P21

[4] COMPACT DESIGN FOR PHOTOTHERMAL DEFLECTION (MIRAGE) - SPECTROSCOPY AND IMAGING [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (06) : 1126 - 1128

[5] LATTICE GAS ASPECTS OF METAL-HYDROGEN SYSTEMS [J]. JOURNAL OF THE LESS-COMMON METALS, 1976, 49 (1-2): : 1 - 12

[6] INTERNAL-STRESS IN GROWING TIO2 FILMS [J]. JOURNAL OF THE LESS-COMMON METALS, 1988, 141 (02): : 335 - 343

[1] INTERNAL STRESSES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 606 - +

[2] NEW TECHNIQUE FOR MEASUREMENT OF ELECTRODE STRAIN DURING ELECTROCHEMICAL REACTIONS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (01) : 45 - 51

[3] CAMPBELL DS, 1970, HDB THIN FILM TECHNO, V12, P21

[4] COMPACT DESIGN FOR PHOTOTHERMAL DEFLECTION (MIRAGE) - SPECTROSCOPY AND IMAGING [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (06) : 1126 - 1128

[5] LATTICE GAS ASPECTS OF METAL-HYDROGEN SYSTEMS [J]. JOURNAL OF THE LESS-COMMON METALS, 1976, 49 (1-2): : 1 - 12

[6] INTERNAL-STRESS IN GROWING TIO2 FILMS [J]. JOURNAL OF THE LESS-COMMON METALS, 1988, 141 (02): : 335 - 343