ULTRASENSITIVE PHOTOTHERMAL DEFLECTION SPECTROMETRY USING AN ANALYZER ETALON

被引：13

作者：

BIALKOWSKI, SE

ZHI, FH

机构：

来源：

ANALYTICAL CHEMISTRY | 1988年 / 60卷 / 24期

关键词：

D O I：

10.1021/ac00175a006

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

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页码：2674 / 2679

页数：6

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