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VELOCITY SATURATION EFFECTS IN N-CHANNEL DEEP-DEPLETION SOS-MOSFETS
被引:8
作者
:
JERDONEK, RT
论文数:
0
引用数:
0
h-index:
0
JERDONEK, RT
BANDY, WR
论文数:
0
引用数:
0
h-index:
0
BANDY, WR
机构
:
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1978年
/ 25卷
/ 08期
关键词
:
D O I
:
10.1109/T-ED.1978.19198
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:894 / 898
页数:5
相关论文
共 5 条
[1]
MODELLING OF SHORT-CHAMMEL MOS TRANSISTORS
[J].
ARMSTRONG, GA
论文数:
0
引用数:
0
h-index:
0
ARMSTRONG, GA
;
MAGOWAN, JA
论文数:
0
引用数:
0
h-index:
0
MAGOWAN, JA
.
ELECTRONICS LETTERS,
1970,
6
(10)
:313
-+
[2]
CARRIER MOBILITY AND CURRENT SATURATION IN MOS TRANSISTOR
[J].
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
;
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1965,
ED12
(03)
:129
-+
[3]
MODELING OPERATION OF NORMAL-CHANNEL DEEP-DEPLETION SOS-MOSFET
[J].
JERDONEK, RT
论文数:
0
引用数:
0
h-index:
0
JERDONEK, RT
;
BANDY, WR
论文数:
0
引用数:
0
h-index:
0
BANDY, WR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1978,
25
(08)
:899
-907
[4]
MEASUREMENT OF HIGH-FIELD CARRIER DRIFT VELOCITIES IN SILICON BY A TIME-OF-FLIGHT TECHNIQUE
[J].
NORRIS, CB
论文数:
0
引用数:
0
h-index:
0
NORRIS, CB
;
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
GIBBONS, JF
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1967,
ED14
(01)
:38
-+
[5]
RONEN RS, 1975, SOLID STATE TECHNOL, V18, P39
←
1
→
共 5 条
[1]
MODELLING OF SHORT-CHAMMEL MOS TRANSISTORS
[J].
ARMSTRONG, GA
论文数:
0
引用数:
0
h-index:
0
ARMSTRONG, GA
;
MAGOWAN, JA
论文数:
0
引用数:
0
h-index:
0
MAGOWAN, JA
.
ELECTRONICS LETTERS,
1970,
6
(10)
:313
-+
[2]
CARRIER MOBILITY AND CURRENT SATURATION IN MOS TRANSISTOR
[J].
HOFSTEIN, SR
论文数:
0
引用数:
0
h-index:
0
HOFSTEIN, SR
;
WARFIELD, G
论文数:
0
引用数:
0
h-index:
0
WARFIELD, G
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1965,
ED12
(03)
:129
-+
[3]
MODELING OPERATION OF NORMAL-CHANNEL DEEP-DEPLETION SOS-MOSFET
[J].
JERDONEK, RT
论文数:
0
引用数:
0
h-index:
0
JERDONEK, RT
;
BANDY, WR
论文数:
0
引用数:
0
h-index:
0
BANDY, WR
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1978,
25
(08)
:899
-907
[4]
MEASUREMENT OF HIGH-FIELD CARRIER DRIFT VELOCITIES IN SILICON BY A TIME-OF-FLIGHT TECHNIQUE
[J].
NORRIS, CB
论文数:
0
引用数:
0
h-index:
0
NORRIS, CB
;
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
GIBBONS, JF
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1967,
ED14
(01)
:38
-+
[5]
RONEN RS, 1975, SOLID STATE TECHNOL, V18, P39
←
1
→