CRYSTALLIZATION TEMPERATURES OF THIN CO-ZR AMORPHOUS ALLOY-FILMS FROM ELECTRON-DIFFRACTION

被引：3

作者：

IDRUS, RM ^{[1
]}

GRUNDY, PJ ^{[1
]}

机构：

[1] UNIV SALFORD, DEPT PURE & APPL PHYS, SALFORD M5 4WT, LANCS, ENGLAND

来源：

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1993年 / 92卷 / 01期

关键词：

07.80; 61.40; 81.15.C;

D O I：

10.1007/BF01309162

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The transformation of amorphous thin alloy films of Co-Zr to the crystalline state was observed with an electron microscope in the diffraction mode. This investigation elucidates the crystallization temperatures, T(x), of thin films as opposed to the T(x) presented for thicker samples; usually melt-quenched in the thickness range of 20-50 mum. The T(x) of the thin films are compared also with the T(x) for sputtered alloys of Co-Zr at 5 mum.

引用

页码：17 / 19

页数：3

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