THE BRITTLE-TO-DUCTILE TRANSITION IN SILICON

被引:106
作者
BREDE, M
机构
[1] Fraunhofer-Institut für angewandte Materialforschung, 2820 Bremen 77
来源
ACTA METALLURGICA ET MATERIALIA | 1993年 / 41卷 / 01期
关键词
D O I
10.1016/0956-7151(93)90353-T
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In order to better understand the brittle-to-ductile transition in silicon, details of different experimental and numerical studies are discussed. In the concept of elastical stress intensity factors, experiments with four-point-bending bars are not directly comparable with experiments done with tapered-double-cantilever-beam samples. The internal elastic and plastic conditions of the samples are different due to large differences of the load levels applied in both cases. A smooth transition from cleavage to semi-brittle fracture with small, relatively homogeneous plastic zones precedes a sharp transition to general plasticity. The fracture toughness between both transitions is independent of temperature, yielding a plateau region. Numerical simulations qualitatively show the same results. The plateau region is a direct consequence of the shielding dynamics, the sharp transition is a consequence of the assumed emission configuration of the dislocations. The simulations do not rely on a heterogeneous distribution of dislocation sources.
引用
收藏
页码:211 / 228
页数:18
相关论文
共 43 条
[1]  
Alexander H., 1986, Dislocations in solids. Vol.7, P113
[2]   Brittle to ductile transition in cleavage fracture [J].
Argon, A. S. .
ACTA METALLURGICA, 1987, 35 (01) :185-196
[3]  
ARGON AS, IN PRESS
[4]  
AZZOUZI H, 1991, P 9 C STRENGTH MET A, P783
[5]  
AZZOUZI H, 1992, THESIS INPL NANCY
[6]   THE INFLUENCE OF PRECIPITATED OXYGEN ON THE BRITTLE-DUCTILE TRANSITION OF SILICON [J].
BEHRENSMEIER, R ;
BREDE, M ;
HAASEN, P .
SCRIPTA METALLURGICA, 1987, 21 (11) :1581-1585
[7]  
BEHRENSMEIER R, 1987, THESIS U GOTTINGEN
[8]   THE BRITTLE-TO-DUCTILE TRANSITION IN DOPED SILICON AS A MODEL SUBSTANCE [J].
BREDE, M ;
HAASEN, P .
ACTA METALLURGICA, 1988, 36 (08) :2003-2018
[9]   BRITTLE CRACK-PROPAGATION IN SILICON SINGLE-CRYSTALS [J].
BREDE, M ;
HSIA, KJ ;
ARGON, AS .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (02) :758-771
[10]  
BREDE M, 1983, THESIS U GOTTINGEN