PROPERTIES OF JOSEPHSON EDGE TYPE JUNCTIONS PREPARED WITH BR-ETHANOL ETCHING

被引:7
作者
FALEY, MI [1 ]
POPPE, U [1 ]
JIAN, CL [1 ]
GLYANTSEV, VN [1 ]
SIEGEL, M [1 ]
URBAN, K [1 ]
机构
[1] FORSCHUNGSZENTRUM JULICH, FORSCHUNGSZENTRUM, INST SCHICHT & IONENTECH, D-52425 JULICH, GERMANY
来源
PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1994年 / 235卷
关键词
D O I
10.1016/0921-4534(94)91519-9
中图分类号
O59 [应用物理学];
学科分类号
摘要
The Josephson junctions were prepared on the edges of c-axis oriented YBa2Cu3O7 thin films structured by chemical etching in a Br-ethanol solution. TEM studies demonstrate epitaxial c-axis oriented growth of all layers. The coherence length of the PrBa2Cu3O7 barrier is estimated to be about 4 nm. The normal state resistance of the junctions has a strong metallic temperature dependence. partial derivative V/partial derivative Phi above 50 mu V/Phi(O) at 77 K was obtained for the dc-SQUIDs prepared on the basis of these junctions with the loop inductance about 200 pH. External magnetic fields up to several Gauss does not affect the amplitude of the flux-voltage characteristic of the dc-SQUIDs. Aging or effects due to thermal cycling an the properties of the junctions and SQUIDs were not observed.
引用
收藏
页码:591 / 592
页数:2
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