PRECISION MICROWAVE MEASUREMENT OF INTERNAL PARASITICS OF TUNNEL-DIODES

被引：5

作者：

BANDLER, JW

机构：

来源：

关键词：

D O I：

10.1109/T-ED.1968.16178

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：275 / &

共 16 条

[1]

BANDLER JW, 1967, 580 MULL RES LAB REP

[2]

BANDLER JW, 1967, THESIS U LONDON

[3]

DICKENS LE, 1967, IEEE T, VMT15, P101

[4]

FUKUI H, 1961 INT SOL CIRC C, P16

[5]

GETSINGER WJ, 1966, IEEE T, VMT14, P58

[6]

GIORDANO AB, 1963, HDB MICROWAVE MEASUR, V1, pCH2

[7]

HAUER WB, 1961, IRE T ELECTON DEVICE, VED 8, P470

[8] EQUIVALENT CIRCUIT OF TUNNEL DIODE [J].

HAWKINS, P ;

MCPHUN, MK .

PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1966, 54 (10) :1451-&

[9]

HAWKINS P, PRIVATE COMMUNICATIO

[10]

KIM CS, 1964, MICROWAVES, V3, P18