GRAZING INCIDENCE SPECTRA OF SI 11 AND SI 12 IONS

被引：18

作者：

TONDELLO, G

机构：

[1] Astrophysics Research Unit, Culham Laboratory, Abingdon, Berks

来源：

JOURNAL OF PHYSICS PART B ATOMIC AND MOLECULAR PHYSICS | 1969年 / 2卷 / 06期

关键词：

D O I：

10.1088/0022-3700/2/6/114

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Wavelength measurements and identifications of several Si XI and Si XII lines in the region 25-303 Angstrom are reported. The spectra were emitted by a laser-produced plasma.

引用

页码：727 / &

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