MEASUREMENTS OF EXCISION REPAIR TRACTS FORMED DURING MEIOTIC RECOMBINATION IN SACCHAROMYCES-CEREVISIAE

被引:48
作者
DETLOFF, P
PETES, TD
机构
[1] UNIV N CAROLINA,DEPT BIOL,CHAPEL HILL,NC 27599
[2] UNIV CHICAGO,DEPT MOLEC GENET & CELL BIOL,CHICAGO,IL 60637
关键词
D O I
10.1128/MCB.12.4.1805
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
During meiotic recombination in the yeast Saccharomyces cerevisiae, heteroduplexes are formed at a high frequency between HIS4 genes located on homologous chromosomes. Using mutant alleles of the HIS4 gene that result in poorly repaired mismatches in heteroduplex DNA, we find that heteroduplexes often span a distance of 1.8 kb. In addition, we show that about one-third of the repair tracts initiated at well-repaired mismatches extend 900 bp.
引用
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页码:1805 / 1814
页数:10
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