A COMBINED SCANNING TUNNELING, SCANNING FORCE, FRICTIONAL FORCE, AND ATTRACTIVE FORCE MICROSCOPE

被引：10

作者：

ENG, LM

JANDT, KD

DESCOUTS, D

机构：

[1] TECH UNIV HAMBURG,KUNSTSTOFFE POLYMERE VERBUNDWERKSTOFFE,W-2100 HAMBURG 90,GERMANY

[2] UNIV GENEVA,APPL PHYS GRP,CH-1211 GENEVA 4,SWITZERLAND

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1994年 / 65卷 / 02期

关键词：

D O I：

10.1063/1.1145143

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report on the adaptation of a commercially available scanning force microscope (SFM) for the simultaneous measurement of electrical and mechanical surface properties combining the scanning tunneling microscope, the SFM, and the friction force microscope. Furthermore, the microscope may be operated in the noncontact or attractive mode (AC-SFM) which is specially suited for the nondestructive investigation of soft sample surfaces.

引用

页码：390 / 393

页数：4

共 16 条

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