THE HEAVY-ION MICROPROBE AT GSI - USED FOR SINGLE ION MICROMECHANICS

被引:55
作者
FISCHER, BE
机构
[1] Planckstr. 1, D-6100 Darmstadt, Germany
关键词
ETCHING - ION BEAMS - MICROANALYSIS - PARTICLE BEAM TRACKING;
D O I
10.1016/0168-583X(88)90012-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Etching of nuclear tracks can yield unique microscopic structures of technical interest in a wide range of different materials. This has already led to many applications using extended beams. Now the heavy ion microprobe has for the first time been used to create micropatterns by shooting every single ion to its desired position. The paper will describe the components of the microprobe essential to the new technique, give an overview over the basic geometries of single ion micromechanics, and show the result of a first experiment.
引用
收藏
页码:284 / 288
页数:5
相关论文
共 6 条
  • [1] ALBRECHT D, 1981, GSI SCI REPORT, P192
  • [2] PREPARATION OF SUPER-INSULATING SURFACES BY THE NUCLEAR TRACK TECHNIQUE
    FISCHER, BE
    ALBRECHT, D
    SPOHR, R
    [J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1982, 65 (1-4): : 143 - 144
  • [3] FISCHER BE, 1983, GSI SCI REPORT, P216
  • [4] FISCHER BE, 1983, REV MOD PHYS, V55, P927
  • [5] INFLUENCE OF IRRADIATION WITH HIGH ENERGETIC IONS ON STORAGE PROPERTIES OF MAGNETO-OPTIC (GD,BI)3(FE,GA)5O12 EPITAXIAL-FILMS
    HEITMAN, H
    FRITZSCHE, C
    HANSEN, P
    KRUMME, JP
    SPOHR, R
    WITTER, K
    [J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1978, 7 (1-4) : 40 - 43
  • [6] HOFMANN D, 1983, IEEE T NUCL SCI, V30, P931