THE PAST, PRESENT, AND FUTURE OF AUGER LINE-SHAPE ANALYSIS

被引:107
作者
RAMAKER, DE
机构
[1] Department of Chemistry, George Washington University, Washington, DC
关键词
AUGER; AES; SPECTRAL LINE SHAPE; ELECTRONIC STRUCTURE;
D O I
10.1080/10408439108243752
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This review critically evaluates the suitability of Auger spectral line shape analysis as a source of electronic structure information. Methods for extracting the true Auger line shape from the raw data and a theoretical framework for semiquantitative interpretation of that line shape are presented. A wide range of recent applications concentrating on the line shapes of the low Z metals (Be, Li, Na, Mg, and Al), the line shapes of C and Si, the transition metals, and, finally, those of the metal oxides and halides are considered. Spectra for gas-phase molecules, adsorbed molecules, and solids are examined. Finally, new methods for controlling the background, the initial state, the spin polarization, and the angle of escape are discussed, along with requirements for improving the theory. Over 350 references are included.
引用
收藏
页码:211 / 276
页数:66
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