PROFILE OF X-RAY-DIFFRACTION LINES IN GUINIER POWDER DIAGRAMS

[1] CHOICE OF COLLIMATORS FOR A CRYSTAL SPECTROMETER FOR NEUTRON DIFFRACTION [J]. NUCLEAR INSTRUMENTS & METHODS, 1958, 3 (04): : 223 - 228

[2] FICHTNERSCHMITT.H, 1976, 8 HUNG DIFFR C TIH

[3] FICHTNERSCHMITT.H, KRISTALL TECHNIK

[4] HOFMANN EG, 1955, Z METALLKD, V46, P601

[5] LEAST-SQUARES STRUCTURE REFINEMENT BASED ON PROFILE ANALYSIS OF POWDER FILM INTENSITY DATA MEASURED ON AN AUTOMATIC MICRODENSITOMETER [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) : 7 - 11

[6] A PROFILE REFINEMENT METHOD FOR NUCLEAR AND MAGNETIC STRUCTURES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 : 65 - &

[7] AUTOMATIC COLLECTION OF POWDER DATA FROM PHOTOGRAPHS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (FEB1) : 1 - 7

[1] CHOICE OF COLLIMATORS FOR A CRYSTAL SPECTROMETER FOR NEUTRON DIFFRACTION [J]. NUCLEAR INSTRUMENTS & METHODS, 1958, 3 (04): : 223 - 228

[2] FICHTNERSCHMITT.H, 1976, 8 HUNG DIFFR C TIH

[3] FICHTNERSCHMITT.H, KRISTALL TECHNIK

[4] HOFMANN EG, 1955, Z METALLKD, V46, P601

[5] LEAST-SQUARES STRUCTURE REFINEMENT BASED ON PROFILE ANALYSIS OF POWDER FILM INTENSITY DATA MEASURED ON AN AUTOMATIC MICRODENSITOMETER [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (FEB1) : 7 - 11

[6] A PROFILE REFINEMENT METHOD FOR NUCLEAR AND MAGNETIC STRUCTURES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 : 65 - &

[7] AUTOMATIC COLLECTION OF POWDER DATA FROM PHOTOGRAPHS [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (FEB1) : 1 - 7