SIGNAL-TO-NOISE ENHANCEMENT BY SUPERPOSITION OF BRIGHT-FIELD IMAGES OBTAINED UNDER DIFFERENT ILLUMINATION TILTS

被引：10

作者：

KUNATH, W

机构：

[1] Institut fur Elektronenmikroskopie am Fritz-Haber-Institut der Max-Planck-Gesellschaft, 1000 Berlin 33 (West)

来源：

ULTRAMICROSCOPY | 1979年 / 4卷 / 01期

关键词：

D O I：

10.1016/0304-3991(79)90003-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A many-fold tilted illumination mode wherein the amount of tilt remains unchanged while the azimuth of the tilt is varied was compared with the standard axial illumination mode when imaging a thin layer of amorphous tungsten. The granularity in the image is strongly suppressed by the first mode, yielding visualization of structures in the tungsten layer. © 1979.

引用

页码：3 / 7

页数：5

共 19 条

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[4]

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[6]

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HOWLAND, LA .

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[8]

KUNATH W, 1978, 9TH P INT C EL MICR, V1, P232

[9]

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[10]

ROSE H, 1974, OPTIK, V39, P416

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