PROCESSING AND QUANTIFICATION OF X-RAY ENERGY-DISPERSIVE SPECTRA IN THE ANALYTICAL ELECTRON-MICROSCOPE

被引：9

作者：

ZALUZEC, NJ

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来源：

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D O I：

10.1016/0304-3991(89)90300-8

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：226 / 235

页数：10

共 32 条

[1]

BENTLEY J, 1985, MATERIALS RES SOC S, V51, P363

[2]

BEVINGTON PR, 1969, DATA REDUCTION ERROR, pCH6

[3] ATOMIC SPUTTERING IN THE ANALYTICAL ELECTRON-MICROSCOPE [J].

BRADLEY, CR ;

ZALUZEC, NJ .

[4]

CHEVALIER JP, 1988, NSF CNRS WORKSHOP EL

[5] QUANTITATIVE-ANALYSIS OF THIN SPECIMENS [J].

CLIFF, G ;

LORIMER, GW .

JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR) :203-207

[6]

DEMING SN, 1973, ANAL CHEM, V45, pA379

[7]

Fiori C.E., 1982, MICROBEAM ANAL 1982, P57

[8]

FIORI CE, 1979, COMPUTES ACTIVATION, P139

[9] RESTORING WITH MAXIMUM LIKELIHOOD AND MAXIMUM ENTROPY [J].

FRIEDEN, BR .

[10]

GEDCKE DA, 1972, XRAY SPECTROM, V1, P129