SCANNING TUNNELING MICROSCOPY OF CHEMICAL VAPOR-DEPOSITION GROWN BISRCACUO FILMS

被引：2

作者：

NAKAMURA, T

KIMURA, T

KIMURA, T

IHARA, M

UMEBU, I

机构：

[1] Fujitsu Laboratories Ltd., Atsugi 243-01

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1990年 / 8卷 / 01期

关键词：

D O I：

10.1116/1.577021

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We have studied chemical vapor deposition (CVD) grown Bi-Sr-Ca-Cu-O superconducting thin films by scanning tunneling microscopy (STM). Under positive sample-bias conditions we could obtain stable topographic images in which a high density of steps along the a or b axis were observed. The heights of some steps were mutiples of 1.5 or 1.8 nm which correspond tohalf of the c axis length in Bi2Sr2Ca1Cu208+δ(low 7c phase) and Bi2Sr2Ca2Cu3O10+δ(high Tc phase), respectively. The domain size of thehigh 7c phase could be estimated to be about several tens of nanometers. © 1990, American Vacuum Society. All rights reserved.

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页码：472 / 474

页数：3

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