CHARACTERISTICS OF EPITAXIAL OVERGROWTHS OF CUPROUS SULFIDE FORMED ON COPPER-FILMS INVESTIGATED BY REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION

被引:5
作者
CAIN, OJ
VOOK, RW
机构
[1] SYRACUSE UNIV,DEPT CHEM ENGN,SYRACUSE,NY 13210
[2] SYRACUSE UNIV,DEPT MAT SCI,SYRACUSE,NY 13210
关键词
D O I
10.1016/0040-6090(78)90302-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:373 / 389
页数:17
相关论文
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