A STM/STS AND XPS STUDY OF OXIDIZED METAL POWDERS

被引：8

作者：

KWETKUS, BA

SATTLER, K

机构：

[1] SWISS FED INST TECHNOL,SOLID STATE PHYS LAB,CH-8093 ZURICH,SWITZERLAND

[2] UNIV HAWAII MANOA,DEPT PHYS & ASTRON,HONOLULU,HI 96822

来源：

ULTRAMICROSCOPY | 1992年 / 42卷

关键词：

D O I：

10.1016/0304-3991(92)90353-L

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

An investigation of oxidized metal powders (Ti, Ag, Cr) by means of different experimental techniques using scanning tunneling microscopy (STM)/-spectroscopy (STS) and X-ray photoelectron spectroscopy (XPS) was carried out. The STM images show a surface roughness of the powder particles in a nanometer-scale range. Stable rectifying behavior was detected in the I-V curves of titanium and chromium in STS. XPS revealed thick oxide layers on most of the particle surfaces. Silver powder showed exceptional behavior in the XPS and the STS measurements.

引用

收藏

页码：749 / 756

页数：8

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