EFFICIENCY OF SECONDARY EMISSION MONITORS FOR ELECTRON BEAMS

被引:16
作者
VANHUYSE, VJ
VANDEVIJVER, RE
机构
来源
NUCLEAR INSTRUMENTS & METHODS | 1962年 / 15卷 / 01期
关键词
D O I
10.1016/0029-554X(62)90028-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:63 / 68
页数:6
相关论文
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