CHARACTERIZATION OF PARASEXIPHENYL THIN-FILMS DEPOSITED UNDER VACUUM

被引:8
作者
ATHOUEL, L
RIOU, MT
FROYER, G
LOUARN, G
LEFRANT, S
SIOVE, A
CHEVROT, C
机构
[1] UNIV PARIS 13,RECH MACROMOLEC LAB,F-93430 VILLETANEUSE,FRANCE
[2] INST MAT NANTES,PHYS CRISTALLINE LAB,F-44072 NANTES,FRANCE
关键词
D O I
10.1051/jcp/1992891271
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
The study of parasexiphenyl thin films deposited under vacuum indicate that deposition parameters - such as evaporation rate, substrate temperature - play a major role. Here we show that the best cristallinity is obtained with a high substrate temperature and a very low evaporation rate. A texture shows up under these experimental conditions, the axis of the parasexiphenyl molecules being normally to the substrate surface.
引用
收藏
页码:1271 / 1277
页数:7
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