ON THE USE OF WIDE-ANGLE ENERGY-SENSITIVE DETECTORS IN WHITE-BEAM X-RAY SINGLE-CRYSTAL DIFFRACTION

被引:3
作者
BURAS, B
OLSEN, JS
GERWARD, L
机构
[1] UNIV COPENHAGEN,PHYS 2 LAB,DK-2100 COPENHAGEN O,DENMARK
[2] TECH UNIV DENMARK,APPL PHYS LAB 3,DK-2800 LYNGBY,DENMARK
来源
NUCLEAR INSTRUMENTS & METHODS | 1980年 / 178卷 / 01期
关键词
D O I
10.1016/0029-554X(80)90867-8
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:131 / 135
页数:5
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