SCATTER FROM X-RAY REFLECTING SURFACES

被引：13

作者：

SCHROEDER, JB

KLIMASEWSKI, RG

机构：

[1] Perkin-Elmer Corporation, Norwalk, CT

来源：

APPLIED OPTICS | 1968年 / 7卷 / 10期

关键词：

D O I：

10.1364/AO.7.001921

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

This paper presents a technique to measure the relative scatter of x-ray reflecting surfaces. Scatter measurements were performed on fused silica, Cer-Vit, beryllium, Kanigen, steel, and silicon. Fused silica surfaces consistently produced the least scatter, while beryllium produced the greatest scatter (4X that of silica), with the other materials being intermediate and approximately equivalent (about 2X as much scatter as silica). © 1968 Optical Society of America.

引用

页码：1921 / +

页数：1

共 18 条

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