VARIATIONS IN COMPOSITION IN BINARY AND TERNARY SEMICONDUCTORS UTILIZING ELECTROLYTE ELECTROREFLECTANCE - TOPOGRAPHICAL INVESTIGATION

被引：23

作者：

POLLAK, FH

OKEKE, CE

VANIER, PE

RACCAH, PM

机构：

来源：

关键词：

D O I：

10.1063/1.325334

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4216 / 4222

页数：7

共 17 条

[1] ELECTRO-OPTIC MEASUREMENTS OF PBS PBSE AND PBTE
ASPNES, DE
CARDONA, M
[J]. PHYSICAL REVIEW, 1968, 173 (03): : 714 - &
[2] ELECTROREFLECTANCE SPECTRA OF ALXGA1-X AS ALLOYS
BEROLO, O
WOOLLEY, JC
[J]. CANADIAN JOURNAL OF PHYSICS, 1971, 49 (10) : 1335 - &
[3] ELECTROREFLECTANCE AT A SEMICONDUCTOR-ELECTROLYTE INTERFACE
CARDONA, M
SHAKLEE, KL
POLLAK, FH
[J]. PHYSICAL REVIEW, 1967, 154 (03): : 696 - +
[4] Cardona M., 1969, MODULATION SPECTROSC
[5] HAMAKAWA Y, 1976, OPTICAL PROPERTIES S, P225
[6] KLINE JS, 1968, HELV PHYS ACTA, V41, P968
[7] KRESSEL H, COMMUNICATION
[8] LOCKWOOD A, COMMUNICATION
[9] ELECTROREFLECTANCE AND FARADAY-ROTATION IN PB1-X-SNXTE
MORITANI, A
PILLER, H
KHAN, SA
[J]. NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA B-GENERAL PHYSICS RELATIVITY ASTRONOMY AND MATHEMATICAL PHYSICS AND METHODS, 1977, 39 (02): : 392 - 396
[10] ELECTROREFLECTANCE STUDY OF CDXHG1-XTE
MORITANI, A
TANIGUCHI, K
HAMAGUCHI, C
NAKAI, J
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1973, 34 (01) : 79 - 88