ELECTRIC-FIELD EFFECT ON SUPERCONDUCTING YBA2CU3O7-DELTA FILMS

被引：139

作者：

MANNHART, J

BEDNORZ, JG

MULLER, KA

SCHLOM, DG

机构：

[1] Zürich Research Laboratory, IBM Research Division, Rüschlikon, CH-8803

来源：

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1991年 / 83卷 / 03期

关键词：

D O I：

10.1007/BF01313398

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Experimental evidence for a significant electric field effect in thin superconducting films of YBa2Cu3O7-delta is presented. MISFET-type structures have been developed which allow the application of electric fields larger than 4 x 10(6) V/cm across insulating SrTiO3 barriers into thin epitaxial YBa2Cu3O7-delta channel layers. The results demonstrate that with these structures the electrical resistivity above T(c) (R = 0) and the density of free carriers in the YBa2Cu3O7-delta films can be modified by 1-2% with gate voltages smaller than 50 V.

引用

页码：307 / 311

页数：5

共 18 条

[1]

BATLOGG B, SELECTED EXPT HIGH T

[2] LARGE SHIFTS OF TRANSITION TEMPERATURE WITH ELECTRIC CHARGING PREDICTED FOR SUPERCONDUCTING SEMICONDUCTORS [J].

BERLINCOURT, TG .

PHYSICS LETTERS A, 1969, A 29 (06) :308-+

[3]

CHAUDHARI P, 1989, Patent No. 324044

[4] METALLIC AND SUPERCONDUCTING SURFACES OF YBA2CU3O7 PROBED BY ELECTROSTATIC CHARGE MODULATION OF EPITAXIAL-FILMS [J].

FIORY, AT ;

HEBARD, AF ;

EICK, RH ;

MANKIEWICH, PM ;

HOWARD, RE ;

OMALLEY, ML .

PHYSICAL REVIEW LETTERS, 1990, 65 (27) :3441-3444

[5]

GAO J, PREPARATION YBACUO U

[6]

Geerk J., 1989, International Journal of Modern Physics B, V3, P923, DOI 10.1142/S0217979289000683

[7] CHANGES IN SUPERCONDUCTING CRITICAL TEMPERATURE PRODUCED BY ELECTROSTATIC CHARGING [J].

GLOVER, RE ;

SHERRILL, MD .

PHYSICAL REVIEW LETTERS, 1960, 5 (06) :248-250

[8]

GLOVER RE, 1965, PHYS REV LETT, V14, P979

[9]

GURVITCH M, 1986, 1986 FALL M MAT RES, P47

[10] CONTACT BETWEEN HIGH-TC SUPERCONDUCTOR AND SEMICONDUCTING NIOBIUM-DOPED SRTIO3 [J].

HASEGAWA, H ;

FUKAZAWA, T ;

AIDA, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (12) :L2210-L2212

← 1 2 →