SURFACE PHONONS AND STRUCTURE OF EPITAXIAL NICKEL LAYERS ON CU(001)

被引：20

作者：

CHEN, Y

TONG, SY

KIM, JS

MOHAMED, MH

KESMODEL, LL

机构：

[1] UNIV WISCONSIN,SURFACE STUDIES LAB,MILWAUKEE,WI 53201

[2] INDIANA UNIV,DEPT PHYS,BLOOMINGTON,IN 47405

来源：

PHYSICAL REVIEW B | 1991年 / 43卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.43.6788

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We compare measured and calculated electron-energy-loss phonon spectra of ultrathin films of Ni grown on Cu(001) to determine the interlayer spacings of the Ni layers. We find a small (approximately 4.6%) expansion in the surface volume of the Ni film at two and four monolayers. Data of Ni-film modes along the GAMMA-BARMBAR and GAMMA-BARXBAR directions are measured for different thickness of the Ni film, and comparison between measured and calculated phonon dispersions of the film modes show considerable relaxation in the intralayer force constant of the overlayer film.

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页码：6788 / 6791

页数：4

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