CAPACITANCE OF ABRUPT P-N-JUNCTION DIODES UNDER FORWARD BIAS

被引:9
作者
GREEN, MA [1 ]
GUNN, MW [1 ]
机构
[1] UNIV QUEENSLAND,DEPT ELECT ENGN,BRISBANE,AUSTRALIA
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1973年 / 19卷 / 01期
关键词
D O I
10.1002/pssa.2210190163
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:K93 / K96
页数:4
相关论文
共 8 条
[1]   INVESTIGATION OF REACTIVE PROPERTIES OF DIFFUSED SI P-N JUNCTIONS IN REGION OF HIGH INJECTION LEVELS AND STRONG ELECTRIC FIELDS [J].
ABDULLAY.GB ;
JAFAROVA, EA ;
ISKENDER.ZA ;
CHELNOKO.VE ;
ALIKHANO.S ;
BADALOV, AZ ;
AKHUNDOV, MR .
SOLID-STATE ELECTRONICS, 1968, 11 (02) :233-&
[2]  
GOKHALE BV, 1970, IEEE T ELEC DEV, VED17, P594
[3]  
GREEN MA, 1971, THESIS U QUEENSLAND
[4]  
MISAWA T, 1957, J PHYS SOC JPN, V12, P883
[5]   AN ANALYSIS OF FREQUENCY DEPENDENCE OF CAPACITANCE OF ABRUPT P-N JUNCTION SEMICONDUCTOR DEVICES [J].
OHEARN, WF ;
CHANG, YF .
SOLID-STATE ELECTRONICS, 1970, 13 (04) :473-&
[6]  
Shockley W., 1952, PHYS TODAY, V5, P18, DOI DOI 10.1063/1.3067420
[7]   APPLICATION OF TRANSMISSION-LINE EQUIVALENT CIRCUIT MODEL TO ANALYSIS OF PN JUNCTION ADMITTANCE UNDER DC BIAS [J].
SMILEY, CF ;
YAU, LD ;
SAH, CT .
SOLID-STATE ELECTRONICS, 1973, 16 (08) :895-901
[8]  
SZE SM, 1969, PHYSICS SEMICONDUCTO