CONSTRUCTION OF EFFICIENCY CURVES FOR SEMICONDUCTOR X-RAY SPECTROMETERS

被引：43

作者：

CAMPBELL, JL

MCNELLES, LA

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS | 1972年 / 98卷 / 03期

关键词：

D O I：

10.1016/0029-554X(72)90225-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：433 / &

共 19 条

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SMITH, HJ
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[3] EFFICIENCY CALIBRATION OF SEMICONDUCTOR X-RAY DETECTORS
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OBRIEN, P
MCNELLES, LA
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[4] NAI(T1) ESCAPE-PEAK TO PHOTOPEAK RATIOS
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[7] INTERNAL CONVERSION COEFFICIENTS OF 392 KEV GAMMA-RAY AND HALF-LIFE OF ISOMERIC STATE IN IN-113
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DEROOST, E
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[J]. INTERNATIONAL JOURNAL OF APPLIED RADIATION AND ISOTOPES, 1971, 22 (01): : 1 - +
[8] HANSEN JE, 1970, PRIVATE COMMUNICATIO
[9] RESPONSE CHARACTERISTICS OF A HIGH-RESOLUTION SI(LI) PHOTON SPECTROMETER
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[J]. NUCLEAR INSTRUMENTS & METHODS, 1970, 82 : 249 - +
[10] JANSEN JFW, 1966, INTERNAL CONVERSION, P237