CRITICAL THICKNESS OF THE AMORPHOUS-NANOCRYSTALLINE TRANSITION IN GD/FE FILM STRUCTURES

被引:62
作者
LANDES, J
SAUER, C
KABIUS, B
ZINN, W
机构
[1] Institut für Festkörperforschung, Forschungszentrum Jülich
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 15期
关键词
D O I
10.1103/PhysRevB.44.8342
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The growth of Gd/Fe layered structures prepared by evaporation in UHV was studied by means of in situ Fe-57 conversion-electron Mossbauer spectroscopy and cross-section high-resolution transmission electron microscopy. The Fe layer grows on the Gd sublayer in an amorphous structure up to a critical Fe thickness of d(c) = 2.3 -/+ 0.1 nm. On further increasing the Fe thickness, a rapid transformation to nanocrystalline structure throughout the total Fe layer occurs. This effect is suggested to be due mainly to the extreme misfit between the structural parameters of Fe and Gd.
引用
收藏
页码:8342 / 8345
页数:4
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