ELECTROCHEMICAL AND XPS STUDIES ON LACQUER LOW TINPLATED STEEL ADHESION

被引:42
作者
INGO, GM
GIORGI, L
ZACCHETTI, N
AZZERRI, N
机构
[1] ILVA,I-16128 GENOA,ITALY
[2] ENTE NAZL ENERGIA ATOM,CTR RECH ENERGIA,I-00100 ROME,ITALY
[3] CTR SPERIMENTALE MET SPA,ROME,ITALY
关键词
D O I
10.1016/0010-938X(92)90066-C
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In order to promote lacquer adhesion different surface treatments have been carried out on low tinplated steels (LTS). The surface chemical composition and semiconduction properties of these materials have been studied by means of a combined use of X-ray photo-electron spectroscopy (XPS), in high energy resolution, and electrochemical analytical techniques. Along with the adhesion measurements, this study has shown that lacquer adhesion is enhanced with increase in the extent of p-type semiconduction, achieved by increasing the amount of anodically grown Sn4+ oxide and by a passive film of Cr(III) oxide. It has been suggested that p-type oxides (acceptor sites) interact, during the lacquer curing with lacquer organic functional groups to form chemical and stable bonds. The effect on the lacquer adhesion of the oxide thickness and their hydration depth has been also discussed.
引用
收藏
页码:361 / 377
页数:17
相关论文
共 59 条
[1]  
[Anonymous], 1980, ELECTROCHEMISTRY SEM
[2]   QUANTITATIVE USE OF ANGULAR VARIATION TECHNIQUE IN STUDIES OF TIN BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
ANSELL, RO ;
DICKINSON, T ;
POVEY, AF ;
SHERWOOD, PMA .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 11 (03) :301-313
[3]   X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF TIN ELECTRODES AFTER POLARIZATION IN SODIUM-HYDROXIDE SOLUTION [J].
ANSELL, RO ;
DICKINSON, T ;
POVEY, AF ;
SHERWOOD, PMA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (09) :1360-1364
[4]   IONICITY OF METALLIC OXIDE SURFACES ON METALS AS OBSERVED BY AUGER (XPS) SPECTROSCOPY [J].
ASCARELLI, P ;
MORETTI, G .
SURFACE AND INTERFACE ANALYSIS, 1985, 7 (01) :8-12
[5]  
AUBRUN PJ, 1976, REV METALL, P745
[6]   A CRITICAL-EVALUATION OF ELECTROANALYSIS METHODS FOR THE DETERMINATION OF CHROMIUM SPECIES IN PASSIVATION LAYERS ON TINPLATE BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
AZZERRI, N ;
INGO, G ;
BATTISTONI, C ;
MATTOGNO, G ;
PAPARAZZO, E .
SURFACE TECHNOLOGY, 1984, 21 (04) :391-404
[7]  
AZZERRI N, Patent No. 4826486
[8]  
AZZERRI N, 1986, OCT P GIORN ELETTR I, P55
[9]  
AZZERRI N, Patent No. 878302272
[10]   ESCA STUDIES OF NATURALLY PASSIVATED METAL FOILS [J].
BARR, TL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (01) :660-665