TECHNIQUES FOR FIELD-ION MICROSCOPY OF COPPER, GOLD AND ALUMINUM

被引：10

作者：

BOYES, ED ^{[1
]}

SOUTHON, MJ ^{[1
]}

机构：

[1] UNIV CAMBRIDGE,DEPT MET & MAT SCI,CAMBRIDGE CB2 3QZ,ENGLAND

来源：

关键词：

D O I：

10.1016/0042-207X(72)90217-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：447 / 451

页数：5

共 8 条

[1] BOYES ED, 1971, 25TH P ANN M EMAG I, P256
[2] FORBES RG, 1970, THESIS CAMBRIDGE
[3] Muller E.W., 1961, J APPL PHYS, V32, P2425, DOI 10.1063/1.1777085
[4] Muller E W, 1969, FIELD ION MICROSCOPY
[5] THE EFFECT OF POLARIZATION, FIELD STRESS, AND GAS IMPACT ON THE TOPOGRAPHY OF FIELD EVAPORATED SURFACES
MULLER, EW
[J]. SURFACE SCIENCE, 1964, 2 : 484 - 494
[6] PEDDER DJ, 1972, THESIS CAMBRIDGE
[7] FORMATION AND MIGRATION OF ARTIFACT VACANCIES INDUCED ON GOLD SURFACES BY NEON FIELD ION MICROSCOPY
SCHMID, TE
BALLUFFI, RW
[J]. SURFACE SCIENCE, 1971, 28 (01) : 32 - &
[8] USE OF A CHANNELLED IMAGE INTENSIFIER IN FIELD-ION MICROSCOPE
TURNER, PJ
CARTWRIGHT, P
SOUTHON, MJ
VANOOSTR.A
MANLEY, BW
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 731 - +