COMPARATIVE-STUDY OF FLUORESCENCE-YIELD AND ELECTRON-YIELD DETECTION ON YBA2CU3O7-DELTA AT THE O K EDGE THROUGH X-RAY ABSORPTION

被引：34

作者：

TROGER, L

ARVANITIS, D

RABUS, H

WENZEL, L

BABERSCHKE, K

机构：

[1] Institut für Experimentalphysik, Freie Universität Berlin, D-1000 Berlin 33

来源：

PHYSICAL REVIEW B | 1990年 / 41卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.41.7297

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The near-edge and extended x-ray absorption fine structures of YBa2Cu3O7- have been studied above the O K edge in ultrahigh vacuum by means of electron and O K fluorescence yields (probing depths of 100 and 2000). The electron yield data significantly differ from the fluorescence-yield ones. Upon scraping the samples surface only the fluorescence yield data remain unaffected establishing this technique as the appropriate one for photoabsorption at the O K edge. © 1990 The American Physical Society.

引用

页码：7297 / 7300

页数：4

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