DIRECT OBSERVATION OF THE ATOMIC-FORCE MICROSCOPY TIP USING INVERSE ATOMIC-FORCE MICROSCOPY IMAGING

被引:36
作者
MONTELIUS, L [1 ]
TEGENFELDT, JO [1 ]
VANHEEREN, P [1 ]
机构
[1] THERMOINSTRUMENT SYST BV,4817 NL BREDA,NETHERLANDS
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1994年 / 12卷 / 03期
关键词
D O I
10.1116/1.587746
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is a well-known fact in scanning probe microscopy that the tip geometry will be convoluted with the shape of the sample. In this study we report on a clear-cut in situ direct observation of the real shape of the atomic force microscopy (AFM) tip using the AFM technique itself, utilizing a specially designed sample. The sample was an array of columns fabricated using aerosol deposition of metal particles and subsequent plasma etching. In this article we report on the so-called inverse AFM mode in which the tip is actually used as the sample and vice versa. We will present results using ordinary AFM tips and ''tapping-mode'' tips as well as high-aspect-ratio supertips (Nanoprobe). We propose how this method can, with a very high accuracy, be used for studying objects, e.g., biomolecules, that are deliberately attached to the usual AFM cantilever tip. Finally, ve discuss how this method can significantly increase the reliability of the obtained AFM images.
引用
收藏
页码:2222 / 2226
页数:5
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