PERTURBATION MEASUREMENT OF TRANSVERSE R/Q IN IRIS-LOADED WAVEGUIDES

被引：6

作者：

HAHN, H

HALAMA, HJ

机构：

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1968年 / MT16卷 / 01期

关键词：

D O I：

10.1109/TMTT.1968.1126591

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：20 / &

共 29 条

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