X-RAY-DIFFRACTION STUDY OF THIN ELECTROLUMINESCENT ZNS FILMS GROWN BY ATOMIC LAYER EPITAXY

被引：41

作者：

TANNINEN, VP

OIKKONEN, M

TUOMI, TO

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1981年 / 67卷 / 02期

关键词：

D O I：

10.1002/pssa.2210670227

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：573 / 583

页数：11

共 36 条

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