RELIABILITY OF PROBE MEASUREMENTS IN HOT CATHODE GAS DIODES

被引：89

作者：

WEHNER, G

MEDICUS, G

机构：

来源：

关键词：

D O I：

10.1063/1.1702342

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1035 / 1046

页数：12

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