APPLICATION OF HOLOGRAPHY TO COMPLETE STRESS ANALYSIS OF PHOTOELASTIC MODELS

被引：5

作者：

DHIR, SK

PETERSON, HA

机构：

来源：

关键词：

D O I：

10.1007/BF02329099

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：560 / &

共 8 条

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FOURNEY, ME ;

MATE, KV .

[2]

HOLLOWAY DC, 1969, TAM329 U ILL

[3]

HOVANESIAN JD, 1969, OCT SOC EXP STR AN F

[4]

KUSKE A, 1968, EXP MECH, V8, P384

[5]

NISIDA M, 1964, EXP MECH, V4, P366

POST, D .

[7] INTERPRETATION OF FRINGES IN STRESS-HOLO-INTERFEROMETRY [J].

SANFORD, RJ ;

DURELLI, AJ .

[8] ON INTERFEROMETRIC METHOD OF STRESS ANALYSIS [J].

SRINATH, LS ;

MEHROTRA, CL .