INFLUENCE OF CRYSTAL-STRUCTURE ON THE MAGNETORESISTANCE OF CO/CU MULTILAYERS

被引：20

作者：

LEDANG, K ^{[1
]}

VEILLET, P ^{[1
]}

VELU, E ^{[1
]}

PARKIN, SSP ^{[1
]}

CHAPPERT, C ^{[1
]}

机构：

[1] IBM CORP,ALMADEN RES CTR,SAN JOSE,CA 95120

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 01期

关键词：

D O I：

10.1063/1.109728

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The saturation magnetoresistance (MR) and Co nuclear magnetic resonance (NMR) spin echo have been measured in a series of sputtered Co/Cu multilayers, with Co thicknesses ranging from 10 to 30 angstrom. The multilayers were grown on 50 angstrom Cu or Fe buffer layers. A clear correlation has been established between the MR and the Co NMR line profile. The sample with the highest MR exhibits a single fcc Co line with weak-intensity wings. Increasing the number of (111) layer stacking faults and grain boundaries leads to decreasing MR.

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页码：108 / 110

页数：3

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