DETERMINATION OF THE NATURE OF STACKING-FAULT TETRAHEDRA IN ELECTRON-IRRADIATED SILVER BY HIGH-RESOLUTION STRUCTURAL IMAGING

被引：22

作者：

SIGLE, W

JENKINS, ML

HUTCHISON, JL

机构：

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1988年 / 57卷 / 05期

关键词：

D O I：

10.1080/09500838808203777

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：267 / 271

页数：5

共 11 条

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[5] EVIDENCE FOR STACKING-FAULT TETRAHEDRA FORMED FROM SELF-INTERSTITIALS IN ELECTRON-IRRADIATED SILVER [J].

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