MAGNETIC STABILITY OF FE-9.0WT-PERCENT-SI/PERMALLOY MULTILAYERED FILMS IN HIGH-TEMPERATURE PROCESSES

被引:2
作者
OHJI, H
TANABE, S
KATAOKA, M
OZEKI, T
机构
[1] Materials & Electronic Devices Laboratory., Mitsubishi Electric Corporation, Hyogo, 661
关键词
D O I
10.1109/20.179678
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Fe-9.0wt%Si/permalloy multilayered film has high initial permeability. However, the permeability decreases drastically after annealing at above 400-degrees-C because of the Ni diffusion at the boundary between permalloy and Fe-Si layers. We tried to improve the magnetic stability of the multilayered films in high temperature annealing in magnetic head fabrication processes. However, the crystallization is disordered during a high temperature process because of the diffusion at the boundary. Depositing each Fe-Si layer in more than 0.6-mu-m thickness and using a lower Ar pressure, such as 3mTorr, good soft magnetic properties can be obtained even after annealing at 500-degrees-C.
引用
收藏
页码:2937 / 2939
页数:3
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