SCANNING ELECTRON-DIFFRACTION STUDY OF VAPOR-DEPOSITED AND ION-IMPLANTED THIN-FILMS OF GE (II)

被引：27

作者：

GRACZYK, JF ^{[1
]}

CHAUDHAR.P ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

PHYSICA STATUS SOLIDI B-BASIC RESEARCH | 1973年 / 58卷 / 02期

关键词：

D O I：

10.1002/pssb.2220580209

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：501 / 510

页数：10

共 15 条

[1] CALCULATION OF INTERCRYSTALLINE-INTERFERENCE CONTRIBUTION TO SCATTERING OF X-RAYS BY ARRAYS OF SMALL CRYSTALLITES [J].

BETTS, F ;

BIENENSTOCK, A .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (11) :4591-+

[2] ELECTRON-MICROSCOPE INVESTIGATION OF STRUCTURE OF SOME AMORPHOUS MATERIALS [J].

CHAUDHARI, P ;

HERD, SR ;

GRACZYK, JF .

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1972, 51 (02) :801-+

[3] COHERENT SCATTERING IN A RANDOM-NETWORK MODEL FOR AMORPHOUS SOLIDS [J].

CHAUDHARI, P ;

CHARBNAU, HP ;

GRACZYK, JF .

PHYSICAL REVIEW LETTERS, 1972, 29 (07) :425-+

[4]

COCHRAN W, 1972, RC4110 IBM RES REP

[5]

DOVE DB, PRIVATE COMMUNICATIO

[6] AMORPHOUS GERMANIUM AND SILICON (STRUCTURE ANDTRANSPORT PHENOMENA) [J].

GRIGOROVICI, R .

MATERIALS RESEARCH BULLETIN, 1968, 3 (01) :13-+

[7]

GRIGOROVICI R, 1971, THIN SOLID FILMS, V9, P1

[8]

GRIGOROVICI R, 1967, THIN SOLID FILMS, V1, P343

[9]

Guinier A, 1952, XRAY CRYSTALLOGRAPHI

[10]

HENDERSO.D, 1971, B AM PHYS SOC, V16, P348

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