BAYESIAN ESTIMATION AND OPTIMAL DESIGNS IN PARTIALLY ACCELERATED LIFE TESTING

被引:183
作者
DEGROOT, MH [1 ]
GOEL, PK [1 ]
机构
[1] PURDUE UNIV,W LAFAYETTE,IN 47907
关键词
D O I
10.1002/nav.3800260204
中图分类号
C93 [管理学]; O22 [运筹学];
学科分类号
070105 ; 12 ; 1201 ; 1202 ; 120202 ;
摘要
引用
收藏
页码:223 / 235
页数:13
相关论文
共 8 条
[1]   OPTIMAL SEQUENTIAL ACCELERATED LIFE TEST [J].
BESSLER, S ;
CHERNOFF, H ;
MARSHALL, AW .
TECHNOMETRICS, 1962, 4 (03) :367-&
[2]   OPTIMAL ACCELERATED LIFE DESIGNS FOR ESTIMATION [J].
CHERNOFF, H .
TECHNOMETRICS, 1962, 4 (03) :381-&
[3]  
DeGroot, 1970, OPTIMAL STAT DECISIO, V82
[4]  
Epstein B., 1960, TECHNOMETRICS, V2, P447, DOI [10.1080/00401706.1960.10489911, DOI 10.1080/00401706.1960.10489911]
[5]  
Goel P. K., 1975, SCANDINAVIAN ACTURIA, V2, P109
[6]  
Goel P.K, 1971, THESIS CRANEGIE MELL
[7]   OPTIMUM ACCELERATED LIFE-TESTS FOR WEIBULL AND EXTREME VALUE DISTRIBUTIONS [J].
MEEKER, WQ ;
NELSON, W .
IEEE TRANSACTIONS ON RELIABILITY, 1975, 24 (05) :321-332
[8]   THEORY FOR OPTIMUM CENSORED ACCELERATED LIFE TESTS FOR NORMAL AND LOGNORMAL LIFE DISTRIBUTIONS [J].
NELSON, W ;
KIELPINSKI, TJ .
TECHNOMETRICS, 1976, 18 (01) :105-114